Published
IEC 60747-14-3:2009 specifies requirements for semiconductor pressure sensors measuring absolute, gauge or differential pressures. The major technical change with regard to the previous edition is the addition of a new subclause 5.9 (measuring method of linearity). <br /><br />This publication should be read in conjunction with <a href=''http://webstore.iec.ch/webstore/webstore.nsf/artnum/035699''>IE C 60747-1:2006</a>.
PUBLISHED
SSH IEC 60747-14-3:2009
60.60
Standard published
Jul 7, 2016