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IEC 60747-5-4:2006 ED1

Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

Publication date: Feb 23, 2006

General information

Current stage: 99.60 Effective date: Apr 27, 2022

Originator: IEC

Owner: TC 47/SC 47E

Type: International Standard

ICS: 31.080.01 31.260

Languages: English French

Buying

Status: Revised

PDF - ALL 21,483

Paper - ALL 21,483

CD - ALL 21,483

Language

Language in which you want to receive the document.

Scope

Deals with the terminology, the essential ratings and characteristics as well as the measuring methods of semiconductor lasers.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60747-5-1:1997/AMD1:2001 ED1

WITHDRAWN
IEC 60747-5-1:1997 ED1

WITHDRAWN
IEC 60747-5-1:1997/AMD2:2002 ED1

WITHDRAWN
IEC 60747-5-2:1997 ED1

WITHDRAWN
IEC 60747-5-3:1997 ED1

WITHDRAWN
IEC 60747-5-2:1997/AMD1:2002 ED1

WITHDRAWN
IEC 60747-5-3:1997/AMD1:2002 ED1

NOW

WITHDRAWN
IEC 60747-5-4:2006 ED1
99.60 Withdrawal effective
Apr 27, 2022

REVISED BY

PUBLISHED
IEC 60747-5-4:2022 ED2