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IEC 60747-5-3:1997/AMD1:2002 ED1

Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Publication date: Mar 25, 2002

General information

Current stage: 99.60 Effective date: Feb 23, 2016

Originator: IEC

Owner: TC 47/SC 47E

Type: International Standard

Languages: English French

Buying

Status: Replaced

PDF - ALL 9,046

Paper - ALL 9,046

CD - ALL 9,046

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Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60747-5:1992 ED2

WITHDRAWN
IEC 60747-5:1992/AMD1:1994 ED2

WITHDRAWN
IEC 60747-5:1992/AMD2:1995 ED2

WITHDRAWN
IEC 60747-5-3:1997 ED1

NOW

WITHDRAWN
IEC 60747-5-3:1997/AMD1:2002 ED1
99.60 Withdrawal effective
Feb 23, 2016

REVISED BY

WITHDRAWN
IEC 60747-5-4:2006 ED1

WITHDRAWN
IEC 60747-5-5:2007 ED1

WITHDRAWN
IEC 60747-5-6:2016 ED1

PUBLISHED
IEC 60747-5-7:2016 ED1