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prSSH IEC 60747-5-14:2022 ED1:2024

Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method

General information

40.60     10 maj 2024

50.99   

DPS

DPS/KT 7

International Standard

31.080.99  

Scope

IEC 60747-5-14:2022(E) specifies the measuring method of the surface temperature of single LED die or package, based on the thermoreflectance (TR) method. TR is the effect that the reflectance of light changes with the temperature of a substance. This part measures relative change in the reflectance of light from a metal film deposited nearby on the metallurgical pn junction as the relative change in the LED junction temperature. The surface temperature can be approximated as the junction temperature when the thermal resistance effect between the metal surface and the pn junction is negligibly small.

Life cycle

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IN_DEVELOPMENT
prSSH IEC 60747-5-14:2022 ED1:2024
40.60 Close of voting
10 maj 2024

Related project

Adopted from IEC 60747-5-14:2022 ED1