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prSSH IEC 60747-18-4:2023 ED1

Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

General information

40.60     10 maj 2024

50.99   

DPS

DPS/KT 7

International Standard

31.080.99  

Scope

IEC 60747-18-4:2023(E) specifies the evaluation method for noise characteristics of lens-free CMOS photonic array sensors. This document includes the measurement setup, test procedure, test items, evaluation method, and test report for noise characteristics of lens-free CMOS photonic array sensors.

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prSSH IEC 60747-18-4:2023 ED1
40.60 Close of voting
10 maj 2024

Related project

Adopted from IEC 60747-18-4:2023 ED1