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ISO 22493:2008

Microbeam analysis — Scanning electron microscopy — Vocabulary
19 sht 2008
95.99 Withdrawal of Standard   9 pri 2014

General information

95.99     9 pri 2014

ISO

ISO/TC 202/SC 1

International Standard

37.020     01.040.37  

anglisht   frëngjisht  

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Scope

ISO 22493:2008 defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts classified according to their hierarchy in a systematic order, with those terms that have already been defined in ISO 23833 also included, where appropriate.
The vocabulary is applicable to all standardization documents relevant to the practice of SEM. In addition, some clauses of the vocabulary are applicable to documents relevant to related fields (e.g. EPMA, AEM, EDS) for the definition of terms which are relevant to such fields.

Life cycle

NOW

WITHDRAWN
ISO 22493:2008
95.99 Withdrawal of Standard
9 pri 2014

REVISED BY

PUBLISHED
ISO 22493:2014