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IEC 60747-5-3:1997/AMD1:2002 ED1

Amendment 1 - Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
25 mar 2002

General information

99.60     23 shk 2016

IEC

TC 47/SC 47E

International Standard

31.080.99  

anglisht   frëngjisht  

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WITHDRAWN
IEC 60747-5-3:1997/AMD1:2002 ED1
99.60 Withdrawal effective
23 shk 2016