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IEC 60747-5-3:1997 ED1

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
25 nën 2009

General information

99.60     23 shk 2016

IEC

TC 47/SC 47E

International Standard

31.260  

anglisht   frëngjisht  

Buying

Replaced

Language in which you want to receive the document.

Scope

Describes the measuring methods applicable to the optoelectronic devices which are not intended to be used in the fibre optic systems or subsystems.

Life cycle

PREVIOUSLY

WITHDRAWN
IEC 60747-5:1992 ED2

WITHDRAWN
IEC 60747-5:1992/AMD1:1994 ED2

WITHDRAWN
IEC 60747-5:1992/AMD2:1995 ED2

NOW

WITHDRAWN
IEC 60747-5-3:1997 ED1
99.60 Withdrawal effective
23 shk 2016

CORRIGENDA / AMENDMENTS

WITHDRAWN
IEC 60747-5-3:1997/AMD1:2002 ED1

REVISED BY

WITHDRAWN
IEC 60747-5-4:2006 ED1

WITHDRAWN
IEC 60747-5-5:2007 ED1

WITHDRAWN
IEC 60747-5-6:2016 ED1

PUBLISHED
IEC 60747-5-7:2016 ED1