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Fixed resistors for use in electronic equipment - Part 2-10: Blank detail specification: Low-power film resistors with leads for through-hole assembly on circuit boards (THT), for general electronic equipment, classification level G
10.00 Proposal for new project registered
Fixed resistors for use in electronic equipment - Part 2: Sectional specification: Low-power film resistors with leads for through-hole assembly on circuit boards (THT)
40.60 Close of voting
Fixed resistors for use in electronic equipment - Part 4-10: Blank detail specification: Power resistors with axial leads for through-hole assembly on circuit boards (THT), for general electronic equipment, classification level G
40.60 Close of voting
Fixed resistors for use in electronic equipment - Part 8: Sectional specification: Fixed surface mount resistors
40.60 Close of voting
Packaging of components for automatic handling - Part 6-1: Bulk case packaging for miniaturized surface mounting components
40.60 Close of voting
Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors
40.60 Close of voting
Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature
40.60 Close of voting
Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
40.60 Close of voting
Semiconductor devices - Part 18-5: Semiconductor bio sensors - Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light
40.60 Close of voting
Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method
40.60 Close of voting
Semiconductor devices - Part 5-15: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage based on the electroreflectance spectroscopy
40.60 Close of voting
Semiconductor devices - Part 5-16: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
40.60 Close of voting
Pajisjet gjysmëpërçuese - Metodat e provës mekanike dhe klimatike - Pjesa 30: Parakushtet e pajisjeve jo hermetike të montuara në sipërfaqe para provës së sigurisë
60.55 Ratification completed (DOR)
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
40.60 Close of voting
Fixed inductors for electromagnetic interference suppression - Part 2-1: Blank detail specification - Inductors for which safety tests are required
40.60 Close of voting
Varistors for use in electronic equipment - Part 2: Blank detail specification for zinc oxide surge suppression varistors. Assessment level E
40.60 Close of voting
Electrostatics - Part 6-2: Electrostatic control in healthcare, commercial and public facilities - Public spaces and office areas
40.60 Close of voting
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